Die level testing using machine grooved storage tray with vacuum channels
US7014527B2 · kind B2 · utility
2Cited by
10References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 16, 2003 |
| Grant date | Mar 21, 2006 |
| Priority date | — |
| Expiry date | Jun 30, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing dies using a machine grooved storage tray with vacuum channels. The method involves drawing a vacuum upon the dies while held in the storage tray and using an automated vision system to map the location of dies in the pockets of the storage tray. Using the map, the storage tray is maneuvered for 5 each individual die in relation to a test probe in order that contact and testing may be made between the discrete die and the test probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.