Patent · US Expired

Method for stress reduction in flip chip bump during flip chip mounting and underfill process steps of making a microelectronic assembly

US7015066B2 · kind B2 · utility

7Cited by
53References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 5, 2001
Grant dateMar 21, 2006
Priority date
Expiry dateJul 31, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/53265
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of making a microelectronic assembly buying restraining a substrate in a fixture at room temperature, placing a flip chip on the substrate so that conductive bumps on the flip chip are aligned with contact pads on the substrate, heating the flip chip, the substrate and the fixture to reflow the conductive bumps on the flip chip, cooling the flip chip, substrate and fixture to solidify the conductive bumps and to mount the flip chip to the substrate, depositing an underfill between the flip chip and the substrate, curing the underfill by heating the flip chip, substrate, underfill and fixture to an elevated temperature, and removing the flip chip mounted substrate from the fixture.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.