Method and apparatus for analyzing a distribution
US7016805B2 · kind B2 · utility
4Cited by
18References
129Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 14, 2001 |
| Grant date | Mar 21, 2006 |
| Priority date | — |
| Expiry date | Dec 14, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, apparatus, and article of manufacture for analyzing a measurable distribution having random components and deterministic components. The method includes the steps of collecting data, constructing a probability density function based on the data such that the probability density function is a convolution of deterministic functions and random functions, constructing a probability density function based on a deterministic and random convolution model having three or more parameters wherein at least one of the parameters are unknown, and determining unknown parameters by using a deconvolution process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.