Test head for integrated circuit tester
US7019546B1 · kind B1 · utility
1Cited by
2References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 25, 2004 |
| Grant date | Mar 28, 2006 |
| Priority date | — |
| Expiry date | Jul 10, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2891
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test head for a semiconductor integrated circuit tester includes first and second card cages and first and second groups of interface connectors for engagement by DUT edges of pin electronics cards installed in the first and second card cages respectively. The interface connectors of the first group are inclined at an angle less than 180° to the interface connectors of the second group.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.