Module, system and method for testing a phase locked loop
US7023195B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2003 |
| Grant date | Apr 4, 2006 |
| Priority date | — |
| Expiry date | May 18, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A digital test module (5) is provided for testing a phase locked loop circuit. The module (5) includes phase detection circuitry (10) for performing phase measurements of the phase locked loop circuit and analog test circuitry (20) for testing at least one analog element of the phase locked loop circuit. Frequency measurement circuitry (30) is provided for performing frequency measurements of the phase locked loop circuit, as is circuitry (40) for performing calibration and jitter measurements. In this way cycle-to-cycle and phase jitter measurements may be made. A calibration mechanism is provided allowing a process evaluation to be made and which allows the jitter data to be provided in a few seconds. The fully digital design facilitates easy manufacture and ready retargeting of the module to diverse applications and processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.