Using a parametric measurement unit for converter testing
US7023366B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 25, 2005 |
| Grant date | Apr 4, 2006 |
| Priority date | — |
| Expiry date | May 25, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1071
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt.In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.