Patent · US Expired

Semiconductor device and a method for fabricating a semiconductor device

US7026547B1 · kind B1 · utility

2Cited by
6References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 21, 2005
Grant dateApr 11, 2006
Priority date
Expiry dateJan 21, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19041
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device (10) includes a semiconductor component integrated in a semiconductor substrate and a conductive pad (110) arranged on top of the semiconductor device (10). The conductive pad is electrically connected with the semiconductor component. The pad is arranged for connecting the semiconductor device (10) externally. A dielectric material (310) is positioned between the conductive pad (110) and a buried conductive layer (20) of the semiconductor device. The dielectric material (310) comprises a stress blocking structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.