Patent · US Expired

Apparatus and method for chemical mechanical polishing of substrates

US7029381B2 · kind B2 · utility

4Cited by
46References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 2001
Grant dateApr 18, 2006
Priority date
Expiry dateAug 31, 2022

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/32
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A chemical mechanical polishing system having a wafer carrier assembly is provided. The wafer carrier assembly includes a wafer carrier support frame, a wafer carrier head housing rotable mounted on the wafer carrier support frame, with a base including a bladder bellows operating connecting the wafer carrier base to the wafer carrier head housing such that rotational torque is transferred from the wafer carrier head housing to the wafer carrier base. Further provided is a retaining ring, operatively connected to a retaining ring bearing which allows relative axial motion while constraining relative radial motion between the retaining ring and the wafer carrier head housing; and a retaining ring bellows, operatively connecting the retaining ring bearing to urge the retaining ring against a polishing member. A chamber formed by the bladder bellows, the wafer carrier base and the wafer carrier head housing may be pressurized to load the wafer carrier base against a polishing member, independent of any frictional loads on the retaining ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.