Systems and methods for rapidly automatically focusing a machine vision inspection system
US7030351B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 24, 2003 |
| Grant date | Apr 18, 2006 |
| Priority date | — |
| Expiry date | Sep 3, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Auto focus systems and methods for a machine vision metrology and inspection system provide high speed and high precision auto focusing, while using relatively low-cost and flexible hardware. One aspect of various embodiments of the invention is that the portion of an image frame that is output by a camera is minimized for auto focus images, based on a reduced readout pixel set determined in conjunction with a desired region of interest. The reduced readout pixel set allows a maximized image acquisition rate, which in turn allows faster motion between auto focus image acquisition positions to achieve a desired auto focus precision at a corresponding auto focus execution speed that is approximately optimized in relation to a particular region of interest. In various embodiments, strobe illumination is used to further improve auto focus speed and accuracy. A method is provided for adapting and programming the various associated auto focus control parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.