Patent · US Expired

Ferroelectric transistor for storing two data bits

US7034349B2 · kind B2 · utility

3Cited by
103References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 6, 2004
Grant dateApr 25, 2006
Priority date
Expiry dateAug 3, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/701
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of storing and accessing two data bits in a single ferroelectric FET includes selectively polarizing two distinct ferroelectric regions in the same gate dielectric layer separated by a non-ferroelectric dielectric region. A first ferroelectric region is sandwiched between the substrate and the gate terminal in the region of the source and is polarized in one of two states to form a first data bit within the FET. A second ferroelectric region is sandwiched between the substrate and the gate terminal in the region of the drain and is polarized in one of two states to form a second data bit within the FET. Detection of the first data bit is accomplished by selectively applying a read bias to the FET terminals, a first current resulting when a first state is stored and a second current resulting when a second state is stored. The polarization of the second data bit is accomplished by reversing the source and drain voltages.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.