Patent · US Expired

Integrated circuit tester

US7034520B1 · kind B1 · utility

1Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 9, 2005
Grant dateApr 25, 2006
Priority date
Expiry dateSep 9, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0433
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A product change tool for selectively engaging a product change element with an IC tester interface and disengaging the product change element from the tester interface includes a mobile frame mounted to a base frame and constrained to move relative to the base frame along an axis of linear movement, and a force mechanism for urging the mobile frame to move along the axis of linear movement relative to the base frame. The force mechanism includes first and second links pivotally connected together at their proximal ends and secured at their distal ends to the mobile frame and the base frame respectively. The distal ends of the links are spaced apart along the axis of linear movement and the proximal ends of the links are between the distal ends relative to that axis. An actuator is coupled to the proximal ends of the links for urging the proximal ends of the links in directions transverse to the axis of linear movement, whereby the spacing of the distal ends of the links along the axis changes and the mobile frame moves relative to the base frame along the axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.