Patent · US Expired

Test system for device and method thereof

US7034558B2 · kind B2 · utility

0Cited by

8References

14Claims

0Family size

Assignee

Freeescale Semiconductor, Inc. · US

Inventors

Alfred E. Ortiz · Gilbert, US
Joseph B. Collins · Washington, US

Key dates

Filing date	Jul 31, 2002
Grant date	Apr 25, 2006
Priority date	—
Expiry date	Aug 1, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0416
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In one embodiment, a contactor (200) is provided. The contactor (200) comprises a device side (210), a test circuit board side (155), and a thickness (110). The device side (210) is in communication with at least three electrical contact points (140, 141, 142) of the device (170). The test circuit board side (155) includes a fourth electrical contact point (193) in electrical communication with the circuit board (150). The contactor (200) also includes a first electrical pathway (220) between the first electrical contact point (140) and the second electrical contact point (142). The first electrical pathway (220) bypasses the circuit board (150). The contactor (200) further includes a second electrical pathway (270) between the third electrical contact point (142) and the fourth electrical contact point (193).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.