Patent · US Expired

Method of improving the performance of microstructures

US7034982B2 · kind B2 · utility

3Cited by
10References
82Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 13, 2004
Grant dateApr 25, 2006
Priority date
Expiry dateAug 12, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B26/0833
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A plastically deformable element of a microelectromechanical device is strained so as to improve the lifetime of the microelectromechanical device. The element of the device can be strained by deforming the element into a deformed state and holding the element at the deformed state for a particular time period so as to acquire an amount of plastic deformation. The operation states of the device are calibrated according to the states before straining and the acquired plastic deformation. After then, the device is operated in the calibrated states.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.