Patent · US Expired

Memory device with column select being variably delayed

US7035150B2 · kind B2 · utility

74Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2002
Grant dateApr 25, 2006
Priority date
Expiry dateSep 15, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/229
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory device (10) includes an array (12) of memory cells arranged in rows and columns. Preferably, each memory cell includes a pass transistor coupled to a storage capacitor. A row decoder is coupled to rows of memory cells while a column decoder (14) is coupled to columns of the memory cells. The column decoder (14) includes an enable input. A variable delay (32) has an output coupled to the enable input of the column decoder (14). The variable delay (32) receives an indication (R/W′) of whether a current cycle is a read cycle or a write cycle. In the preferred embodiment, a signal provided at the output of the variable delay (32) is delayed if the current cycle is a read cycle compared to if the current cycle is a write cycle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.