Circuit testing with ring-connected test instrument modules
US7035755B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2002 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Nov 23, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments to test one or more integrated circuits includes a master clock and a controller. The test instruments are connected to form a communication ring. The master clock is connected to each test instrument and provides a clock signal to the one or more test instruments. The controller is connected to the communication ring and is configured to align counters of test instruments to derive a common clock time value from the clock signal. The controller is further configured to generate and send data words into the communication ring to carry the data words to each test instrument. The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.