System and method for measuring transistor leakage current with a ring oscillator
US7038483B1 · kind B1 · utility
37Cited by
13References
19Claims
0Family size
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Key dates
| Filing date | Mar 1, 2005 |
| Grant date | May 2, 2006 |
| Priority date | — |
| Expiry date | Mar 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the transistor leakage current. In one embodiment, the method involves driving a ring oscillator with a dynamic node driver having a leakage test device biased to an off state to produce a test signal. The test signal is extracted and the frequency is measured. The leakage current is estimated from the measured frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.