Patent · US Expired

Method for testing a circuit unit to be tested and test apparatus

US7039838B2 · kind B2 · utility

1Cited by

8References

14Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Manfred Proell · Dorfen, DE
Koen Van der Zanden · Leuven, BE

Key dates

Filing date	Jul 26, 2002
Grant date	May 2, 2006
Priority date	—
Expiry date	Oct 18, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/34
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention provides a method for testing a circuit unit (101) to be tested, in which a test time is reduced, at least one word line (102a–102N) of the circuit unit (101) to be tested being activated by application of at least one test signal (103) to the word line (102a–102N), the at least one word line (102a–102N) being deactivated by removal of the test signal (103) from the word line (102a–102N), the word lines among all the word lines (102a–102N) which have not run through an activation-deactivation cycle being read out in order to determine an influence of the activation and deactivation, and the test result being output.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.