Patent · US Expired

Systems and methods for generating test vectors to analyze cells of electronic gates

US7039886B2 · kind B2 · utility

0Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 27, 2003
Grant dateMay 2, 2006
Priority date
Expiry dateAug 19, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318357
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems, software products and methods generate test vectors to analyze cells of electronic gates. A cell of a cell library is electronically selected. Input combinations of stimuli for the cell are determined. One or more input combinations are removed that do not affect maximum and minimum signal propagation timing through the cell. Test vectors for the cell are generated based upon remaining input combinations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.