Manufacturing method for an electronic device, and the electronic device
US7052624B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2003 |
| Grant date | May 30, 2006 |
| Priority date | — |
| Expiry date | Mar 17, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/20
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The present invention provides a manufacturing method for an electronic device that enables high-yield manufacturing of electronic devices, by detecting potential short circuits between a contact plug and a conductive part contacting the periphery of the contact plug, directly after forming the contact plug; and the electronic device. The manufacturing method includes a hole-forming step of forming a contact hole in an insulating film that covers a conductive part formed on a first main surface of a substrate and an area surrounding the conductive part, the hole being formed beside the conductive part, and the conductive part including a first material; a material-supplying step of supplying a second material to the contact hole, the second material having a reactive property with the first material; and an inspection step, after the second material has been supplied, of inspecting for evidence of a reaction by the conductive part with the second material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.