Patent · US Expired

Deep N wells in triple well structures and method for fabricating same

US7052966B2 · kind B2 · utility

3Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 9, 2003
Grant dateMay 30, 2006
Priority date
Expiry dateMay 15, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/859
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A disclosed method for fabricating a structure in a semiconductor die comprises steps of implanting a deep N well in a substrate, depositing an epitaxial layer over the substrate, and forming a P well and a lateral isolation N well over the deep N well, wherein the lateral isolation N well and the P well are fabricated in the substrate and the epitaxial layer, and wherein the lateral isolation N well laterally surrounds the P well, and wherein the deep N well and the lateral isolation N well electrically isolate the P well. Implanting a deep N well can comprise steps of depositing a screen oxide layer over the substrate, forming a mask over the screen oxide layer, implanting the deep N well in the substrate, removing the mask, and removing the screen oxide layer. Depositing the epitaxial layer can comprise depositing a single crystal silicon over the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.