Patent · US Expired

Scan data collection for better overall data accuracy

US7053369B1 · kind B1 · utility

2Cited by
147References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 18, 2002
Grant dateMay 30, 2006
Priority date
Expiry dateAug 24, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01Q30/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A scan data collection operation includes performing a scanning operation using a scan path that includes a directional component that is additional to a data collection directional component. The collected scan data is mapped to another set of locations, thus allowing for detection of surface features using fewer scans.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.