Kenneth Gilbert Roessler
35Patents
12h-index
20Co-inventors
81Inventor score
Filing activity: Jun 12, 1992 → Jan 6, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6169281A | Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions | Emerging Cross-Sectional Technologies | 45 | Expired |
| US5262643A | Automatic tip approach method and apparatus for scanning probe microscope | Emerging Cross-Sectional Technologies | 45 | Expired |
| US5902928A | Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator | Emerging Cross-Sectional Technologies | 20 | Expired |
| US6079254A | Scanning force microscope with automatic surface engagement and improved amplitude demodulation | Emerging Cross-Sectional Technologies | 19 | Expired |
| US8696818B2 | Debris removal in high aspect structures | Physics | 18 | Active |
| US5801381A | Method for protecting a probe tip using active lateral scanning control | Emerging Cross-Sectional Technologies | 16 | Expired |
| US5918274A | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Emerging Cross-Sectional Technologies | 15 | Expired |
| US5635848A | Method and system for controlling high-speed probe actuators | Physics | 14 | Expired |
| US5360974A | Dual quad flexure scanner | Physics | 13 | Expired |
| US8182609B1 | Apparatus and method for direct surface cleaning | Emerging Cross-Sectional Technologies | 13 | Active |
| US6318159A | Scanning force microscope with automatic surface engagement | Emerging Cross-Sectional Technologies | 12 | Expired |
| US6220084A | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Emerging Cross-Sectional Technologies | 12 | Expired |
| US8287653B2 | Debris removal in high aspect structures | Physics | 9 | Active |
| US10330581B2 | Debris removal from high aspect structures | Physics | 9 | Active |
| US5773824A | Method for improving measurement accuracy using active lateral scanning control of a probe | Emerging Cross-Sectional Technologies | 9 | Expired |
| US5260577A | Sample carriage for scanning probe microscope | Emerging Cross-Sectional Technologies | 7 | Expired |
| US6167753A | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Emerging Cross-Sectional Technologies | 6 | Expired |
| US10384238B2 | Debris removal in high aspect structures | Physics | 5 | Active |
| US7993464B2 | Apparatus and method for indirect surface cleaning | Emerging Cross-Sectional Technologies | 5 | Active |
| US8562749B2 | Wafer fabrication process | Emerging Cross-Sectional Technologies | 2 | Active |
| US6234009A | Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface | Emerging Cross-Sectional Technologies | 2 | Expired |
| US7053369B1 | Scan data collection for better overall data accuracy | Physics | 2 | Expired |
| US11391664B2 | Debris removal from high aspect structures | Physics | 2 | Active |
| US8613803B2 | Apparatus and method for indirect surface cleaning | Emerging Cross-Sectional Technologies | 1 | Active |
| US11311917B2 | Apparatus and method for contamination identification | Emerging Cross-Sectional Technologies | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.