Method and system for an on-chip AC self-test controller
US7058866B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2002 |
| Grant date | Jun 6, 2006 |
| Priority date | — |
| Expiry date | Jul 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for performing AC self-test on an integrated circuit, including a system clock for use during normal operation. The method includes applying a long data capture pulse to a first test register in response to the system clock, and further applying at an speed data launch pulse to the first test register in response to the system clock. Inputting the data from the first register to a logic path in response to applying the at speed data launch pulse to the first test register. Applying at speed data capture pulse to a second test register in response to the system clock. Inputting the output from the logic path to the second test register in response to applying the at speed data capture pulse to the second register. Applying a long data launch pulse to the second test register in response to the system clock.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.