Patent · US Expired

Method of fabricating microelectronic package having a bumpless laminated interconnection layer

US7067356B2 · kind B2 · utility

61Cited by
17References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 2003
Grant dateJun 27, 2006
Priority date
Expiry dateMar 14, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/4614
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A microelectronic device fabrication technology that places at least one microelectronic die within at least one opening in a microelectronic package core and secures the microelectronic die/dice within the opening(s) with an encapsulation material, that encapsulates at least one microelectronic die within an encapsulation material without a microelectronic package core, or that secures at least one microelectronic die within at least one opening in a heat spreader. A laminated interconnector of dielectric materials and conductive traces is then attached to the microelectronic die/dice and at least one of following: the encapsulation material, the microelectronic package core, and the heat spreader, to form a microelectronic device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.