Inspecting method, inspecting system, and method for manufacturing electronic devices
US7068834B1 · kind B1 · utility
18Cited by
10References
34Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 1, 1999 |
| Grant date | Jun 27, 2006 |
| Priority date | — |
| Expiry date | Dec 1, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention has an analyzing unit including an image detection device for producing a plurality of images of a workpiece, a storage for storing detected images produced by the image detection device, and a display having a screen with a first area for displaying a plurality of detected images stored in the storage and a plurality of second areas for classifying the detected images according to features of the detected images, whereby the plurality of detected images are moved on the screen from the first area to selected second areas to classify the plurality of detected images in the second areas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.