Junko Konishi
12Patents
4h-index
25Co-inventors
56Inventor score
Filing activity: Sep 3, 1999 → Jun 22, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6611728B1 | Inspection system and method for manufacturing electronic devices using the inspection system | Electricity | 32 | Expired |
| US7068834B1 | Inspecting method, inspecting system, and method for manufacturing electronic devices | Physics | 18 | Expired |
| US8428336B2 | Inspecting method, inspecting system, and method for manufacturing electronic devices | Physics | 6 | Active |
| US8043772B2 | Manufacturing method and manufacturing system of semiconductor device | Physics | 4 | Active |
| US8625906B2 | Image classification standard update method, program, and image classification device | Electricity | 3 | Active |
| US8209135B2 | Wafer inspection data handling and defect review tool | Physics | 2 | Active |
| US8290241B2 | Analyzing apparatus, program, defect inspection apparatus, defect review apparatus, analysis system, and analysis method | Physics | 2 | Active |
| US8472696B2 | Observation condition determination support device and observation condition determination support method | Physics | 2 | Active |
| US7424336B2 | Test data analyzing system and test data analyzing program | Emerging Cross-Sectional Technologies | 2 | Active |
| US8892494B2 | Device for classifying defects and method for adjusting classification | Physics | 1 | Active |
| US8779360B2 | Charged particle beam device, defect observation device, and management server | Electricity | 1 | Active |
| US9020237B2 | Method for optimizing observed image classification criterion and image classification apparatus | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.