Patent · US Expired

Layout optimization of integrated trench VDMOS arrays

US7071513B1 · kind B1 · utility

1Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 2004
Grant dateJul 4, 2006
Priority date
Expiry dateOct 28, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/519

Abstract

An economical integration of trench VDMOS devices into a conventional BCD process is provided, with the optimization of key aspects of the device layout for low Rds(on) area. Specifically, trench orientation, array geometry, the number of source cells between drain pickups and drain-source spacing are independently optimized. In one embodiment of the invention, the optimized device utilizes a rectangular cell array with an elongation ratio in the range of 5/3–7/3, with a ratio of 5/3 being preferred, and a cell orientation at 45° with respect to the wafer flat on a 100 wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.