Patent · US Expired

Plasma treating apparatus, plasma treating method and method of manufacturing semiconductor device

US7074720B2 · kind B2 · utility

1Cited by
4References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 2002
Grant dateJul 11, 2006
Priority date
Expiry dateOct 24, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2221/6834
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a plasma treating apparatus, a ceramic porous substance having a three-dimensional network structure in which a frame portion 18a formed of ceramic containing alumina is provided continuously like a three-dimensional network is used for the material of an electrode member 17 for the plasma treating apparatus to be attached to the front surface of a gas supplying port of an electrode for plasma generation, and a gas for plasma generation is caused to pass through a hole portion 18b formed irregularly in the three-dimensional network structure. Consequently, the distribution of the gas to be supplied is made uniform to prevent an abnormal discharge so that uniform etching having no variation can be carried out.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.