System and method for calibrating weak write test mode (WWTM)
US7076376B1 · kind B1 · utility
2Cited by
10References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 28, 2004 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Dec 28, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to at least one embodiment, a method comprises measuring drive current of a reference memory cell of a circuit, and determining, based on the measured drive current of the reference memory cell, a drive current to be supplied to a calibration memory cell of the circuit to mimic a defective memory cell. The method further comprises supplying the determined drive current to the calibration memory cell, and using the calibration memory cell to determine strength of a weak write to be utilized by a weak write test for detecting defective memory cells.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.