Dynamic artefact comparison
US7079969B2 · kind B2 · utility
8Cited by
9References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 6, 2003 |
| Grant date | Jul 18, 2006 |
| Priority date | — |
| Expiry date | Mar 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a series of workpieces using a coordinate measuring apparatus, comprising the steps of: measuring a calibrated artefact on a coordinate measuring apparatus at a fast speed 28; generating an error map corresponding to the difference between the calibrated artefact and the measured artefact 30; measuring subsequent workpieces at the same fast speed 34 and correcting the measurements of the subsequent workpieces using the error map 36. The artefact may be one of the workpieces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.