Canary device for failure analysis

US7089138B1 · kind B1 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Pierre Jacques Bouchard · Davidson, US
• Mark C. Hakey · Saint Albans, US
• Mark E. Masters · South Burlington, US
• Leah Pastel · Saint Johnsbury Center, US
• James A. Slinkman · Montpelier, US
• David P. Vallett · Saint Albans, US

Key dates

• Filing date: Feb 25, 2005
• Grant date: Aug 8, 2006
• Expiry date: Feb 25, 2025

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2831
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A diagnostic system and method for testing an integrated circuit during fabrication thereof. The diagnostic system has at least one integrated circuit chip that has an electrical signature associated with it; a sacrificial circuit that is adjacent to the integrated circuit chip and has a known electrical signature associated with it and intentionally mis-designed circuitry; and a comparator adapted to compare the electrical signature of the integrated circuit chip with the known electrical signature of the sacrificial circuit, wherein a match in the electrical signature of the integrated circuit chip with the known electrical signature of the sacrificial circuit indicates that the integrated circuit chip is mis-designed. The diagnostic system further includes a semiconductor wafer that has a plurality of integrated circuit chips and a kerf area separating one integrated circuit chip from another integrated circuit chip. A mis-designed integrated circuit chip has abnormally functioning circuitry.