Inventor · South Burlington, VT, US

Mark E. Masters

17Patents
10h-index
20Co-inventors
68Inventor score

Filing activity: Dec 9, 1996 → Oct 12, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US6970372B1 Dual gated finfet gain cell Electricity 25 Expired
US7135773B2 Integrated circuit chip utilizing carbon nanotube composite interconnection vias Emerging Cross-Sectional Technologies 24 Expired
US7535016B2 Vertical carbon nanotube transistor integration Emerging Cross-Sectional Technologies 23 Expired
US7473633B2 Method for making integrated circuit chip having carbon nanotube composite interconnection vias Emerging Cross-Sectional Technologies 20 Active
US7247877B2 Integrated carbon nanotube sensors Emerging Cross-Sectional Technologies 19 Expired
US7674674B2 Method of forming a dual gated FinFET gain cell Electricity 13 Active
US6307162A Integrated circuit wiring Electricity 12 Expired
US7484423B2 Integrated carbon nanotube sensors Emerging Cross-Sectional Technologies 11 Active
US8039334B2 Shared gate for conventional planar device and horizontal CNT Emerging Cross-Sectional Technologies 10 Active
US8536526B2 Methods of operating a nanoprober to electrically probe a device structure of an integrated circuit Electricity 10 Active
US7566613B2 Method of forming a dual gated FinFET gain cell Electricity 9 Active
US7503021B2 Integrated circuit diagnosing method, system, and program product Physics 7 Expired
US6627926B2 Method of designing and structure for visual and electrical test of semiconductor devices Emerging Cross-Sectional Technologies 7 Expired
US7089138B1 Canary device for failure analysis Physics 3 Expired
US6251773A Method of designing and structure for visual and electrical test of semiconductor devices Emerging Cross-Sectional Technologies 3 Expired
US7838943B2 Shared gate for conventional planar device and horizontal CNT Emerging Cross-Sectional Technologies 1 Active
US7109546B2 Horizontal memory gain cells Emerging Cross-Sectional Technologies 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.