Patent · US Expired

Method of fabricating silicon nitride nanodots

US7092287B2 · kind B2 · utility

513Cited by
58References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 2003
Grant dateAug 15, 2006
Priority date
Expiry dateJul 17, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/72
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming silicon nitride nanodots that comprises the steps of forming silicon nanodots and then nitriding the silicon nanodots by exposing them to a nitrogen containing gas. Silicon nanodots were formed by low pressure chemical vapor deposition. Nitriding of the silicon nanodots was performed by exposing them to nitrogen radicals formed in a microwave radical generator, using N2 as the source gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.