Patent · US Expired

Process analyzer for monitoring electrochemical deposition solutions

US7094323B2 · kind B2 · utility

3Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 2002
Grant dateAug 22, 2006
Priority date
Expiry dateFeb 3, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/4161
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to a process analyzer for analyzing composition of sample electrochemical deposition solutions, comprising at least one microelectrode having a radius of not more than about 5 μm. The process analyzer preferably comprises: (1) two or more independent analytical modules for analyzing fluid samples, (2) a primary manifold communicatively connected to the analytical modules for introducing fluid samples thereinto, and (3) a computational device communicatively associated with the analytical modules for colleting and processing analytical data therefrom, and therefore can be used to conduct automatic and simultaneous analysis of two or more sample solutions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.