Anisotropic conductive connector, probe member, wafer inspecting device, and wafer inspecting method
US7095241B2 · kind B2 · utility
9Cited by
9References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2003 |
| Grant date | Aug 22, 2006 |
| Priority date | — |
| Expiry date | Aug 7, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R12/714
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein are an anisotropically conductive connector, by which good conductivity is retained over a long period of time even when it is used repeatedly over many times or repeatedly used under a high-temperature environment, and applications thereof. The anisotropically conductive connector is an anisotropically conductive connector having an elastic anisotropically conductive film, in which a plurality of conductive parts for connection extending in a thickness-wise direction of the film have been formed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.