Patent · US Expired

Method and system for testing a microprocessor

US7096385B1 · kind B1 · utility

11Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 2002
Grant dateAug 22, 2006
Priority date
Expiry dateJul 26, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2236
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and system for testing a microprocessor. The method includes executing debug application software on an external device, downloading diagnostic program instructions from the external device to a cache memory within the microprocessor via a serial test interface. Once the diagnostic program instructions are loaded into the cache memory, the method includes executing the diagnostic program instructions from within the cache memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.