Patent · US Expired

Method for determining the critical path of an integrated circuit

US7096443B2 · kind B2 · utility

4Cited by

5References

13Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Jorg Berthold · Munich, DE
Henning Lorch · Birkenfeld, DE
Martin Eisele · Birkenfeld, DE

Key dates

Filing date	Jul 15, 2003
Grant date	Aug 22, 2006
Priority date	—
Expiry date	Apr 29, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/3312
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method of determining the critical path of a circuit includes first determining the paths, their mean path transit times and their path transit time fluctuations. Paths having similar statistical parameters are combined to form one path group. For each path group, a statistical group figure is, then, calculated and, for the totality of paths considered, a statistical total figure is calculated. Finally, the critical paths of the circuit are determined by taking into consideration the total figure, comparing the group figures at or above a critical path transit time Tc.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.