Low voltage programmable eFuse with differential sensing scheme
US7098721B2 · kind B2 · utility
31Cited by
10References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2004 |
| Grant date | Aug 29, 2006 |
| Priority date | — |
| Expiry date | Dec 2, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An electronic fuse structure is disclosed for integrated circuits that is programmable with low voltage and incorporates a differential sensing scheme. The programming step is performed at about 1.5 times Vdd while the sense operation is performed at Vdd, which limits the resistance variation through the electronic fuse caused by the sense operation. During the sense operation a gating transistor emulates the voltage drop across a fuse select transistor for the case of an intact fuse. A circuit and method for characterizing the resistance of the electronic fuse is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.