Inventor · Williston, VT, US

Larry Wissel

21Patents
7h-index
38Co-inventors
69Inventor score

Filing activity: Jun 13, 1991 → Apr 27, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US6426641B1 Single pin performance screen ring oscillator with frequency division Physics 60 Expired
US6609228B1 Latch clustering for power optimization Physics 34 Expired
US7098721B2 Low voltage programmable eFuse with differential sensing scheme Electricity 31 Expired
US8619979B2 Physically unclonable function implemented through threshold voltage comparison Electricity 27 Active
US6624677B1 Radiation tolerant flip-flop Electricity 19 Expired
US6490708B2 Method of integrated circuit design by selection of noise tolerant gates Physics 13 Expired
US7793239B2 Method and system of modeling leakage Physics 8 Active
US5118972A BiCMOS gate pull-down circuit Electricity 7 Expired
US7315193B2 Circuitry and method for programming an electrically programmable fuse Electricity 5 Expired
US5389836A Branch isolation circuit for cascode voltage switch logic Electricity 1 Expired
US10346580B2 Checking wafer-level integrated designs for rule compliance Physics 1 Active
US11170151B2 Checking wafer-level integrated designs for rule compliance Physics 1 Active
US7826285B2 Memory column redundancy scheme Physics 1 Active
US10691870B2 Checking wafer-level integrated designs for rule compliance Physics 1 Active
US7345943B2 Unclocked eFUSE circuit Physics 1 Active
US9990459B2 Checking wafer-level integrated designs for antenna rule compliance Emerging Cross-Sectional Technologies 0 Active
US7000155B2 Redundancy register architecture for soft-error tolerance and methods of making the same Physics 0 Expired
US7773437B2 Design structure for improved memory column redundancy scheme Physics 0 Active
US10248755B2 Checking wafer-level integrated designs for antenna rule compliance Emerging Cross-Sectional Technologies 0 Active
US9646125B2 Method for conversion of commercial microprocessor to radiation-hardened processor and resulting processor Physics 0 Active
US7930663B2 Structure for integrated circuit for measuring set-up and hold times for a latch element Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.