Synchronization of multiple test instruments
US7099792B2 · kind B2 · utility
4Cited by
2References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2004 |
| Grant date | Aug 29, 2006 |
| Priority date | — |
| Expiry date | Nov 4, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.