Patent · US Expired

Semiconductor processing-purpose substrate detecting method and device, and substrate transfer system

US7105847B2 · kind B2 · utility

9Cited by
7References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 6, 2005
Grant dateSep 12, 2006
Priority date
Expiry dateJul 6, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/138
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A detecting device includes a sensor support body having a pair of arms, and an optical sensor having a combination of a light emitting unit and a light receiving unit disposed on one and the other of the arms, respectively. A control operation section controls a driving section and, with the arms inserted in a cassette, the sensor support body is moved, thereby performing a scanning operation for scanning the substrate by the optical sensor. The scanning operation is set such that a light beam is related to the substrate while vertically moving at a plurality of scanning positions. The control operation section finds out the presence of absence of the substrate and the position of the front end of the substrate within the cassette on the basis of data obtained from the optical sensor during scanning.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.