Non-contact tester for electronic circuits
US7109730B2 · kind B2 · utility
26Cited by
8References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 25, 2005 |
| Grant date | Sep 19, 2006 |
| Priority date | — |
| Expiry date | Apr 25, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/315
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.