Scanimetrics Inc.
11Patents
8Active
11Granted
47Portfolio score
Filing activity: Sep 19, 2003 → Jan 28, 2013 · 6 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8829934B2 | Method and apparatus for interrogating electronic equipment components | Electricity | 133 | Active |
| US7109730B2 | Non-contact tester for electronic circuits | Physics | 26 | Expired |
| US6885202B2 | Non-contact tester for electronic circuits | Physics | 23 | Expired |
| US8028208B2 | Wireless radio frequency technique design and method for testing of integrated circuits and wafers | Electricity | 11 | Active |
| US8362481B2 | Ultra high speed signal transmission/reception | Electricity | 10 | Active |
| US7183788B2 | Wireless radio frequency technique design and method for testing of integrated circuits and wafers | Electricity | 10 | Expired |
| US8669656B2 | Interconnect having ultra high speed signal transmission/reception | Electricity | 6 | Active |
| US9329579B2 | Wireless sensor device | Electricity | 6 | Active |
| US8125237B2 | Thin film transistor array having test circuitry | Electricity | 5 | Active |
| US8362587B2 | Ultra high speed signal transmission/reception interconnect | Electricity | 4 | Active |
| US8928343B2 | Testing of electronic circuits using an active probe integrated circuit | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.