Patent · US Expired

Probe mounting device for a scanning probe microscope

US7114405B2 · kind B2 · utility

6Cited by

12References

16Claims

0Family size

Assignee

JPK INSTRUMENTS AG · DE

Inventors

Olaf Sünwoldt · Berlin, DE
Heiko Haschke · Rostock, DE

Key dates

Filing date	Sep 24, 2002
Grant date	Oct 3, 2006
Priority date	—
Expiry date	Apr 5, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01Q70/02
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a probe (207) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member (200) for installation in a measuring assembly of a scanning probe microscope. The probe (207) is detachably mounted on the retaining member (200) by means of a clamping member (201), the clamping member being secured in self-locking fashion to the retaining member (200).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.