JPK INSTRUMENTS AG
18Patents
12Active
18Granted
44Portfolio score
Filing activity: May 17, 2002 → Jul 9, 2013 · 11 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7022985B2 | Apparatus and method for a scanning probe microscope | Emerging Cross-Sectional Technologies | 101 | Expired |
| US8415613B2 | Method and apparatus for characterizing a sample with two or more optical traps | Physics | 24 | Active |
| US8506909B2 | Device for receiving a test sample | Physics | 23 | Expired |
| US7442922B2 | Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology | Emerging Cross-Sectional Technologies | 10 | Expired |
| US7114405B2 | Probe mounting device for a scanning probe microscope | Physics | 6 | Expired |
| US7155962B2 | Method and apparatus to study a surfactant | Physics | 5 | Expired |
| US8381311B2 | Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system | Physics | 3 | Active |
| US6998602B2 | Method of and an apparatus for measuring a specimen by means of a scanning probe microscope | Emerging Cross-Sectional Technologies | 3 | Expired |
| US9063335B2 | Apparatus and method for examining a specimen by means of probe microscopy | Physics | 2 | Active |
| US8368017B2 | Method for the operation of a measurement system with a scanning probe microscope and a measurement system | Physics | 2 | Active |
| US7473894B2 | Apparatus and method for a scanning probe microscope | Emerging Cross-Sectional Technologies | 1 | Active |
| US9080937B2 | Apparatus and a method for investigating a sample by means of several investigation methods | Physics | 0 | Active |
| US8898809B2 | Method and apparatus for the combined analysis of a sample with objects to be analyzed | Physics | 0 | Active |
| US8769711B2 | Method for examining a measurement object, and apparatus | Physics | 0 | Active |
| US7971266B2 | Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope | Performing Operations; Transporting | 0 | Active |
| US7934323B2 | Method and a device for the positioning of a displaceable component in an examining system | Physics | 0 | Active |
| US8505109B2 | Measuring probe device for a probe microscope, measuring cell and scanning probe microscope | Performing Operations; Transporting | 0 | Active |
| US9018018B2 | Method and apparatus for determining the cell activation of a target cell by an activator | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.