Determining thickness of slabs of materials by inventors
US7116429B1 · kind B1 · utility
7Cited by
12References
11Claims
0Family size
Inventors
Key dates
| Filing date | Jan 18, 2003 |
| Grant date | Oct 3, 2006 |
| Priority date | — |
| Expiry date | Oct 15, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/0675
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining the thickness of slabs of materials using an interferometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.