Method for estimating EMI in a semiconductor device
US7120551B2 · kind B2 · utility
2Cited by
6References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 9, 2005 |
| Grant date | Oct 10, 2006 |
| Priority date | — |
| Expiry date | Feb 9, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The resistance value of a supply line (Rline), the resistance value of a decoupling capacitor (Rcap), and the resistance value of a transistor (Rmos) are separately calculated from mask layout information of a semiconductor integrated circuit. The resistance value between external terminals (Ri) is calculated from the resistance value Rline, the resistance value Rcap, and the resistance value Rmos.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.