Patent · US Expired

Method for optimizing a number of kernels used in a sum of coherent sources for optical proximity correction in an optical microlithography process

US7127699B2 · kind B2 · utility

2Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2003
Grant dateOct 24, 2006
Priority date
Expiry dateNov 2, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/36
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method is provided for optimizing the number of kernels N used in a sum of coherent sources (SOCS) for optical proximity correction in an optical microlithography process, including setting the number of kernels N to a predetermined minimum value Nmin, where a determination is made as to whether an accuracy estimate of calculated intensity is within a tolerable value, and a determination is also made as to whether an added X/Y asymmetry estimate of the calculated intensity is negligible.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.