High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
US7130375B1 · kind B1 · utility
64Cited by
6References
18Claims
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Key dates
| Filing date | Jan 14, 2005 |
| Grant date | Oct 31, 2006 |
| Priority date | — |
| Expiry date | Jan 14, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/6113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.