Xradia, Inc.
38Patents
19Active
38Granted
51Portfolio score
Filing activity: Apr 25, 2002 → Aug 12, 2010 · 17 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7787588B1 | System and method for quantitative reconstruction of Zernike phase-contrast images | Physics | 76 | Active |
| US7245696B2 | Element-specific X-ray fluorescence microscope and method of operation | Physics | 70 | Expired |
| US7920676B2 | CD-GISAXS system and method | Physics | 69 | Active |
| US7394890B1 | Optimized x-ray energy for high resolution imaging of integrated circuits structures | Physics | 68 | Expired |
| US7183547B2 | Element-specific X-ray fluorescence microscope and method of operation | Physics | 67 | Expired |
| US7130375B1 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source | Physics | 64 | Expired |
| US8068579B1 | Process for examining mineral samples with X-ray microscope and projection systems | Physics | 64 | Active |
| US7215736B1 | X-ray micro-tomography system optimized for high resolution, throughput, image quality | Physics | 59 | Expired |
| US7119953B2 | Phase contrast microscope for short wavelength radiation and imaging method | Emerging Cross-Sectional Technologies | 58 | Expired |
| US7268945B2 | Short wavelength metrology imaging system | Physics | 56 | Expired |
| US7057187B1 | Scintillator optical system and method of manufacture | Physics | 52 | Expired |
| US6914723B2 | Reflective lithography mask inspection tool based on achromatic Fresnel optics | Physics | 51 | Expired |
| US7406151B1 | X-ray microscope with microfocus source and Wolter condenser | Physics | 50 | Active |
| US8353628B1 | Method and system for tomographic projection correction | Electricity | 50 | Active |
| US7400704B1 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source | Physics | 49 | Active |
| US7095822B1 | Near-field X-ray fluorescence microprobe | Emerging Cross-Sectional Technologies | 48 | Expired |
| US7813475B1 | X-ray microscope with switchable x-ray source | Electricity | 48 | Active |
| US7561662B2 | X-ray micro-tomography system optimized for high resolution, throughput, image quality | Physics | 48 | Active |
| US7974379B1 | Metrology and registration system and method for laminography and tomography | Physics | 47 | Active |
| US7796725B1 | Mechanism for switching sources in x-ray microscope | Electricity | 47 | Active |
| US7388942B2 | X-ray micro-tomography system optimized for high resolution, throughput, image quality | Physics | 47 | Active |
| US7499521B2 | System and method for fuel cell material x-ray analysis | Physics | 46 | Active |
| US6917472B1 | Achromatic fresnel optics for ultraviolet and x-ray radiation | Physics | 45 | Expired |
| US7414787B2 | Phase contrast microscope for short wavelength radiation and imaging method | Emerging Cross-Sectional Technologies | 45 | Active |
| US7443953B1 | Structured anode X-ray source for X-ray microscopy | Electricity | 45 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.